MELBOURNE, Aug. 18 (Xinhua) -- Researchers have developed an X-ray technique that can image two overlapping samples simultaneously, potentially doubling scanning efficiency and expanding applications in industry and research.
The technique, known as dual-sample multimodal imaging (DSI), captures detailed information from two objects in a single scan, according to a statement released recently by Australia's Monash University.
Unlike conventional multimodal X-ray imaging, which analyses one sample at a time, DSI separates and reconstructs images of both overlapping objects without additional scans, according to the study published in Optica.
Researchers confirmed the method by comparing it with an established multimodal X-ray imaging technique. Across biological samples and microelectronic devices, DSI produced comparable image quality while simultaneously imaging two samples.
Lead researcher Marie-Christine Zdora from Monash University's School of Physics and Astronomy said the approach challenged a long-held assumption in X-ray imaging.
"Instead of treating a second object as something that gets in the way of seeing the other sample, we use it to help create the image," Zdora said, adding that each sample could help image the other, allowing detailed information about both to be recovered from the same dataset.
The researchers said the technique could improve inspection in areas including microelectronics, advanced manufacturing, materials science and the life sciences, where imaging speed and efficiency are critical.
Zdora said the work was a proof of principle that could eventually lead to faster and more efficient imaging systems. The team hopes to extend the technique to three-dimensional imaging and laboratory-based X-ray systems, "bringing it closer to practical industrial applications." Enditem
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